Innovations High-Security IC Test Technology with Dynamic Keys
■Technology Introduction

We proposed a dynamic-key secure DFT (Design for Testability) structure that can generate the keys dynamically and defend scan-based and memory attacks without decreasing the system performance and the testability. Analysis results show that our method can achieve a very high security level and the security level will not decrease no matter how many times the attacker guesses due to the dynamic characteristic of our method.
 
■Scientific Innovation
  1. Using the dynamic key and maintaining a high security level.
  2. Generating the fake response to mislead the attacker.
  3. Hidding the secure design by embedding the key pin into the scan input pins.
  4. Do not need to share the test key with testers within the IC supply chain.
 
■This technology won the Futuretech Breakthrough Award in 2019 Future Tech Expo. 


■Institutes
National Cheng Kung University
Ling-Lan Hsieh /hll67@mail.ncku.edu.tw

 
High-Security IC Test Technology with Dynamic Keys
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